An Enhanced Transient Angle Stability Scheme of VSG Based on the PCH Theory

Authors

Jiadong Sun, Xiangyang Xing, Rui Zhang, Chenghui Zhang

Abstract

With the increasing number of distributed generations connected to the grid, the inertia of power grid turns out to be decreased. To address this problem, the virtual synchronous generator (VSG) is proposed, which mimics the mechanical characteristics of the traditional synchronous generators (SGs). However, the introduction of virtual inertia will induce the transient angle instability, which threatens the security and stability of power system when the grid voltage sag occurs. Few methods can effectively tackle this problem, particularly, when the grid voltage sag is severe. In this article, the mechanism of transient angle instability is analyzed, and an enhanced transient angle stability (TAS) scheme is proposed. First, the VSG system is designed as a port-controlled Hamiltonian (PCH) system. Based on the energy shaping, the control law of the PCH system, i.e., the reference active power of VSG is constructed to be model based. Second, benefitting from this model, the TAS can be enhanced by modifying the reference active power via the state variable feedback. Thus, an enhanced TAS scheme that employs the power angle variation is proposed. Moreover, the proposed scheme is proved to be effective in terms of the equal area criterion (EAC) even if the severe grid voltage sag occurs. Finally, the simulations and experiments are carried out to validate the effectiveness of the proposed scheme.

Citation

• Journal: IEEE Transactions on Industrial Electronics
• Year: 2025
• Volume: 72
• Issue: 4
• Pages: 3861–3871
• Publisher: Institute of Electrical and Electronics Engineers (IEEE)
• DOI: 10.1109/tie.2024.3454485

BibTeX

@article{Sun_2025,
  title={{An Enhanced Transient Angle Stability Scheme of VSG Based on the PCH Theory}},
  volume={72},
  ISSN={1557-9948},
  DOI={10.1109/tie.2024.3454485},
  number={4},
  journal={IEEE Transactions on Industrial Electronics},
  publisher={Institute of Electrical and Electronics Engineers (IEEE)},
  author={Sun, Jiadong and Xing, Xiangyang and Zhang, Rui and Zhang, Chenghui},
  year={2025},
  pages={3861--3871}
}

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